MIL-STD-883 in device screening is not required.
● Particle Impact Noise Detection (PIND), Test method 2020
of MIL-STD-883 in device screening and group C testing is
not required.
● Die Shear Strength, Test method 2019 of MIL-STD-883 in
group B testing is not required.
● Internal Water Vapor Content, Test method 1018 of
MIL-STD-883 in group C testing is not required.
● Scanning Electron Microscope (SEM) inspections, Test
method 2018 of MIL-STD-883 in element evaluation is not
required.
Applications
● commercial aerospace
● High reliability systems
● Aircraft controls
● I/O modules
● Harsh industrial environments